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PAL18R4N Datasheet

I Any and all SANYO products described or contained applications that require extremely high levels of re control systems, or other applications whose failure physical and/or material damage. Consult with your any SANYO products described or contained herein
PAL18R4N Price

	1	2	3	4	5	6	7	8	9	10	11
A	NC	Vss	NC		BWl	K	NC		SA	Vss	NC
B	NC	Q9	D9	SA	NC	K	BWo	SA	NC	NC	Q8
c	NC	NC	D10	Vss	SA	SA	SA	Vss	NC	Q7	D8
D	NC	D11	Q10	Vss	Vss	Vss	Vss	Vss	NC	NC	D7
E	NC	NC	Q11	VDDC!	Vss	Vss	Vss	VDDO	NC	D6	Q6
F	NC	Q12	D12	VDDQ	VDD	Vss	VDD	VDDO	NC	NC	Q5
G	NC	D13	Q13	VDDQ	VDD	Vss	VDD	VDDO	NC	NC	D5
H	NC	VREF	VDDO	VDDQ	VDD	Vss	VDD	VDDO	VDDQ	VREF	ZQ
J	NC	NC	D14	VDDQ	VDD	Vss	VDD	VDDO	NC	Q4	D4
K	NC	NC	Q14	VDDC!	VDD	Vss	VDD	VDDO	NC	D3	Q3
L	NC	Q15	D15	VDDC!	Vss	Vss	Vss	VDDO	NC	NC	Q2
M	NC	NC	D16	Vss	Vss	Vss	Vss	Vss	NC	Q1	D2
N	NC	D17	Q16	Vss	SA	SA	SA	Vss	NC	NC	D1
P	NC	NC	Q17	SA	SA	c	SA	SA	NC	DO	oo
R	TDO	TCK	SA	SA	SA	C	SA	SA	SA	TMS	TDI

PAL18R4N on stock

The ATF1516AS contains up t0 160 110 pins and 4 input pins, depending on the device type and package type selected. Each input pin and l/0 pin has its own boundary scan cell (BSC) in order to support boundary scan testing as described in detail by IEEE Standard 1149.1. Typical BSC consists of three capture registers or scan registers and up to two update registers. There are two types of BSCs, one for input or l/0 pin, and one for the macrocells. The BSCs in the device are chained together through the capture registers. Input to the capture register chain is fed in from the TDI pin while the output is directed to the TDO pin. Capture registers are used to capture active device data signals, to shift data in and out of the device and to load data into the update registers. Control signals are gen- erated internally by the JTAG TAP controller. The BSC configuration for the input and l/0 pins and macrocells are shown below.


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