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PAL20LBACNS Datasheet
Applications The versatility of FRAM technology fits into many diverse applications. Clearly the strength of higher write endurance and faster writes make FRAM superior to EEPROM in all but one-time programmable applications. The advantage is most obvious in data collection environments where writes are frequent and data must be nonvolatile.
PAL20LBACNS Price

eni Input Noise Voltage Density, RTI fo =lkHz 7.5 nV/dlz
eno Output Noise Voltage Density, RTI fo =lkHz 67 n\U d{z
In Input Noise Current fo = O.lHz t0 10Hz 10 pAPP
Input Noise Current Density fo =10Hz 124 fA/ tr}lz
RIN Input Resistance VIN=+10V 200 Gl
UlNfDlFFl Differential Input Capacitance fo= lOOkHz 1.6 pF


PAL20LBACNS on stock
FEATURES 3.OV & 3.3V power supply. LVCMOS compatible with multiplexed address. Four banks operation. MRS cycle with address key programs. -. CAS latency (1, 2 & 3). -. Burst length (1, 2, 4, 8 & Full page). -. Burst type (Sequential & Interleave). EMRS cycle with address key programs. . All inputs are sampled at the positive going edge of the system clock Burst read single-bit write operation. Special Function Support. -. PASR (Partial Array Self Refresh). -. Internal TCSR (Temperature Compensated Self Refresh) DQM for masking. Auto refresh. 64ms refresh period (8K cycle). Commercial Temperature Operation (-250C ~ 700C). Extended Temperature Operation (-250C ~ 850C). . 54Balls BOC with 0.8mm ball pitch ( -X : Leaded, -Z : Lead Free).

SYMBOL PARAMETER TYP. MAX UNIT
VDS drain-source voltage 12 V
ID drain current 30 mA
Ptot total power dissipation 200 mW
Ti junction temperature 150 ][C
l Yfs I transfer admittance 28 35 mS
Cigl-s input capacitance at gate 1 2.35 2.75 pF
Crs feedback capacitance 25 fF
F noise figure at 800 MHz 1.7 dB