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Note 9: Long-term drift typically has a logarithmic characteristic and therefore changes after 1000 hours tend to be smaller than before that time. Total drift in the second thousand hours is normally less than one third that to the first thousand hours with a continuing trend toward reduced drift with time. Long-term drift is affected by differential stress between the lC and the board material created during board assembly. See Applications Information. Note 10: Hysteresis in the output voltage is created by package stress that differs depending on whether the lC was previously at a higher or lower temperature. Output voltage is always measured at 25IC, but the lC is cycled t0 85rC or -40rC before a successive measurements. Hysteresis is roughly proportional to the square of the temperature change. Hysteresis is not normally a problem for operational temperature excursions where the instrument might be stored at high or low temperature. See Applications Information.