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RNR55C4750FS Datasheet
NOTES: 1. Stresses beyond those listed may cause permanent damage to the device. These are stress ratings only and functional operation of the device at these or any other conditions beyond those indicated under "recommended operating conditions" is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability. 2. The performance capability of a high-performance integrated circuit in conjunction with its thermal environment can create junction temperatures which are detrimental to reliability. The maximum junction temperature of this integrated circuit should not exceed 150YC. 3. The input and output negative voltage ratings may be exceeded if the input and output clamp current ratings are observed.
RNR55C4750FS Price

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RNR55C4750FS on stock

Items Symbols Test Conditions Min Typ. Max Units
Zero Gate Voltage Collector Current ICES VCE=OV VCE=1400V 1 0 mA
Gate-Emitter Leackage Current IGES VCE=OV VGE=+ 20V 200 uA
Gate-Emitter Threshold Voltage VGE(thl VCE=20V lc=50mA 6 0 8 0 9 0 V
Ti= 250C VGE=15V lc=50A 2 7 3 0 V
Collector-Emitter Saturation Voltage VCE(sat) Ti=1250C VGE=15V lc=50A 3 3
Input capacitance Cies VGE=OV 5000 pF
Output capacitance Coes VCE=10V 750
Reverse Transfer capacitance Cres f=lMHz 330
tON Vcc=600V 1 2
Turn-on Time tr lc=50A 0 6
tOFF VGE=+ 15V 1 0 US
Turn-off Time tf Rc=2,4Q 0 3
Diode Forward On-Voltage VF IF=50A VCE=OV 2 4 3 3 V
Reverse Recovery Time t IF=50A 350 ns


B85 =1 [pF] B85 =0 [pF] B84 B83 B82 B81 B80 B79 B78
O 8.0 1 1 1 1 1 1 1
0.5 8.5 1 1 1 1 1 1 0
1.0 9.0 1 1 1 1 1 O 1
1.5 19.5 1 1 1 1 1 O 0
63.0 71.0 0 O O O 0 O O
63.5 71.5 0 O O O 0 O O