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VGE = li; ·V
T l = ZO¨ = 125IC I


SIE22 SIE22 SIE22 on stock

IC = 50
j
vcc= 20( V
/cc= 30C -V
r
f
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l


PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
Analog Output
Coarse gain linearity (INL) LSB = 1/10tr, of full scale +0.016 LSB
Fine gain linearity (INL) +3 LSB
Offset error Mid-code offset 0.003 %FSR
Without internal reference 0.7
Gain error With internal reference 0.7 %FSR
Gain mismatch With internal reference, dual DAC, SSB mode -2 2 %FSR
Full-scale output current(3) 2 20 mA
Output compliance range(4) IOUTFS = 20 mA AVDD - 0.5 AVDD + 0.5 V
Output resistance 300 kl
Output capacitance 5 pF
Reference Output
Reference voltage 1.14 1.2 1 26 V
Reference output current(5) 100 nA
Reference Input
VEXTIO Input voltage range O1 1 25 V
Input resistance 1 Ml
Small-signal bandwidth 2.5 kHz
Input capacitance 100 pF
Temperature Coefficients
Offset d rift +3 ppm of FSR/IC
Without internal reference +15 ppm of
Gain drift With internal reference +40 FSR/IC
Reference voltage drift +25 ppmnC
Power Supply
AVDD Analog supply voltage 3 3.33.6 V
DVDD Digital supply voltage 1.65 1.8 1 95 V
CLKVDD Clock supply voltage 3 3.33.6 V
IOVDD l/0 supply voltage 1.65 3.6 V
PLLVDD PLL supply voltage 3 3.33.6 V
Single (quad) DAC mode; including output current through load resistor, mode 7 30
IAVDD Analog supply current Dual DAC mode; including output current through load resistor, mode 11 55 mA
IDVDD Digital supply current 242 mA
ICLKVDD Clock supply current fDATA = 125 MSPS, SSB mode, 10 mA
IPLLVDD PLL supply current Fupdate = 500 MSPS, 40-MHz IF 28 mA
IIOVDD lo supply current <3 mA