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STDC-103 Datasheet Read cycles are initiated with ADSP(regardless of WEx and ADS )using the new external address clocked into the on-chip address register whenever ADSP is sampled low, the chip selects are sampled active, and the output buffer is enabled with OE. In read oper- ation the data of cell array accessed by the current address, registered in the Data-out registers by the positive edge of CLK, are car- ried to the Data-out buffer by the next positive edge of CLK. The data, registered in the Data-out buffer, are projected to the output pins. ADV is ignored on the clock edge that samples ADSP asserted, but is sampled on the subsequent clock edges. The address increases internally for the next access of the burst when WEx are sampled High and ADV is sampled low. And ADSP is blocked to control signals by disabling CSi. STDC-103 Price ARCHITECTURE OVERVIEW Figure l shows a block diagram ofthe ADSP-2104/ADSP-2109 architecture. The processor contains three independent compu- tational units: the ALU, the multiplier/accumulator (MAC), and the shifter. The computational units process 16-bit data directly and have provisions to support multiprecision computations. The ALU performs a standard set of arithmetic and logic operations; division primitives are also supported. The MAC performs single-cycle multiply, multiply/add, and multiply/ subtract operations. The shifier performs logical and arithmetic shifts, normalization, denormalization, and derive exponent operations. T he shifier can be used to efficiently implement numeric format controlincluding multiword floating-point representations. STDC-103 on stock Limiting values definition - Limiting values given are in accordance with the Absolute Maximum Rating System (IEC 60134). Stress above one or more of the limiting values may cause permanent damage to the device. These are stress ratings only and operation of the device at these or at any other conditions above those given in the Characteristics sections of the specification is not implied. Exposure to limiting values for extended periods may affect device reliability.
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