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STK407-090E T Datasheet

Symbol	Parameter	Test Conditions	Min	Typ.	Max	Unit
td(off) tf	Turn-o Delay Time Fall Time	VDD = 20 V ID = 1.5 A RG = 4.7 [ , VGS = 10 V (Resistive Load, Figure 3)		100 22		ns ns
td(off) tf te	Turn-o Delay Time Fall Time Cross-over Time	ID=3 A V v		95 11 35		ns ns ns

STK407-090E T on stock

Based upon the harmonics of the fundamental 990.5 H z test tone, and the noise components in the audio band, the total har- monic distortion + noise ofthe device is calculated. The AD 1862 is available in two performance grades. T he AD 1862N produces a maximum of0.0025% THD+N at o dB signallev- els. T he higher performance AD 1862N -J produces a maximum of0.0016% THD+N at o dB signal levels.

Altera FLEX 10KE device s are enhanced ver sion s of FLEX 10K devices. Based on reconfigurable CMOS SRAM elements, the FLEX architecture incorporates all features necessary to implement common gate array megafunctions. With up t0 200,000 typical gates, FLEX 10KE devices p rovide the density, speed, and features to integrate entire system s, including multiple 32-bit bu ses, into a single device.

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